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Fix S.D.Tracing testapps with AOT #101373
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I believe what the test is doing is not trim safe and only succeeds due to lucky IL trimming implementation details.
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Tagging subscribers to this area: @agocke, @MichalStrehovsky, @jkotas |
| public TestEventSource() : base(EventSourceSettings.EtwSelfDescribingEventFormat) { } | ||
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| [Event(1)] | ||
| [DynamicDependency(DynamicallyAccessedMemberTypes.PublicProperties, typeof(TestSubData))] |
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I assume this worked with ILLink because the property was accessed in IL (both the getter and the setter).
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Yep, calling the getter or setter keeps the property right now.
The property could still be removed in theory since what is used is just getter/setter method, but illink never does it right now (it could do it if DebuggerSupport=false, since it makes debugging sub-optimal). It's what I called "lucky IL trimming implementation details".
I believe what the test is doing is not trim safe and only succeeds due to lucky IL trimming implementation details.
I believe what the test is doing is not trim safe and only succeeds due to lucky IL trimming implementation details.
Contributes to #101228.
I believe what the test is doing is not trim safe and only succeeds due to lucky IL trimming implementation details.